About Xiaozhou Liao’s work
From February to August 1996, Xiaozhou Liao held a Croucher Visitorship at City University of Hong Kong. At the time, Liao was based at the Chinese Academy of Sciences.
Biography
Liao graduated from Huaqiao University at the age of 19 and received his PhD degree from the University of Sydney in 2000. Liao uses advanced electron microscopy techniques to examine materials at atomic resolution, laying the groundwork for the design of superior materials for applications including in the semiconductor, automobile and aviation industries.